Epitaxial c-axis oriented BaTiO3 thin films on SrTiO3-buffered Si(001) by atomic layer deposition
نویسندگان
چکیده
by atomic layer deposition Thong Q. Ngo, Agham B. Posadas, Martin D. McDaniel, Chengqing Hu, John Bruley, Edward T. Yu, Alexander A. Demkov, and John G. Ekerdt Department of Chemical Engineering, The University of Texas at Austin, Austin, Texas 78712, USA Department of Physics, The University of Texas at Austin, Austin, Texas 78712, USA Department of Electrical Engineering, The University of Texas at Austin, Austin, Texas 78712, USA IBM Research Division, Yorktown Heights, New York 10593, USA
منابع مشابه
Direct Comparison of Structural and Electrical Properties of Epitaxial (001)-, (116)-, and (103)-Oriented SrBi2Ta2O9 Thin Films on SrTiO3 and Silicon Substrates
Anisotropies of the properties of the bismuth-layered perovskite SrBi2Ta2O9 (SBT) have been investigated using epitaxial thin films grown by pulsed laser deposition both on conducting Nb-doped SrTiO3 (STO) single crystal substrates and on Si(100) substrates. It has been found that the three-dimensional epitaxy relationship SBT(001)||STO(001); SBT ] 0 1 1 [ ||STO[100] can be applied to all SBT t...
متن کاملStructural and electrical properties of c-axis epitaxial homologous SrmÀ3Bi4TimO3m¿3 „mÄ3, 4, 5, and 6... thin films
c-axis epitaxial thin films of Bi-layered homologous Srm23Bi4TimO3m13 (m53, 4, 5, and 6! were fabricated on ~001! SrTiO3 single crystal substrates by pulsed laser deposition, respectively. Microstructures of the films were systematically characterized by x-ray diffraction ~including u–2u scans, rocking curve scans and f scans!, atomic force microscopy, and transmission electron microscope. Epit...
متن کاملPulsed laser deposition and characterization of Bi3.25Nd0.75Ti3O12 thin films buffered with La0.7Sr0.3MnO3 electrode
Bi3.25Nd0.75Ti3O12 (BNT) ferroelectric thin films with a thickness of f0.5 Am, on substrates of Pt/Ti/SiO2/Si, (100) SrTiO3 and (100) MgO, with a 0.4-Am-thick La0.7Sr0.3MnO3 (LSMO) layer as bottom electrode, were deposited via pulsed laser deposition. The multilayer thin films were characterized by X-ray diffraction (XRD), scanning electron microscopy (SEM) and electrical measurement. The LSMO ...
متن کاملStructural and electrical properties of c-axis epitaxial and polycrystalline Sr3Bi4Ti6O21 thin films
c-axis epitaxial and polycrystalline Sr3Bi4Ti6O21 (SBTi) thin films were fabricated on (001)SrTiO3 (STO) single-crystal substrates and Pt/Ti2/SiO2/Si substrates respectively, by pulsed laser deposition (PLD). Structures of the films were systematically characterized by x-ray diffraction (XRD), including θ–2θ -scans, rocking curve scans and φ-scans, atomic force microscopy and transmission elect...
متن کاملFerroelectric BaTiO3/SrTiO3 multilayered thin films for room-temperature tunable microwave elements
Ferroelectric BaTiO3/SrTiO3 with optimized c-axis-oriented multilayered thin films were epitaxially fabricated on (001) MgO substrates. The microstructural studies indicate that the in-plane interface relationships between the films as well as the substrate are determined to be (001)SrTiO3//(001)BaTiO3//(001)MgO and [100]SrTiO3//[100]BaTiO3//[100]MgO. The microwave (5 to 18 GHz) dielectric meas...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
عنوان ژورنال:
دوره شماره
صفحات -
تاریخ انتشار 2014